| 000 |
|
01367nam0 2200313 450 |
| 001 |
|
1000167295 |
| 005 |
|
20230410105157.0 |
| 010 |
__ |
■a978-7-03-037606-0■dCNY95.00 |
| 100 |
__ |
■a20181121d2013 em y0chiy50 ea |
| 101 |
1_ |
■achi■cswe |
| 102 |
__ |
■aCN■b110000 |
| 105 |
__ |
■aak a 000yy |
| 106 |
__ |
■ar |
| 200 |
1_ |
■a微电子技术的可靠性■d= Reliability of microtechnology■e互连、器件及系统■eint+...... |
| 210 |
__ |
■a北京■c科学出版社■d2013.06 |
| 215 |
__ |
■axi, 179页■c图■d24cm |
| 304 |
__ |
■a题名题其余责任者: Olli Salmela, Jussi Sarkka, James E. Morris, Per+...... |
| 320 |
__ |
■a有书目 |
| 330 |
__ |
■a本书详尽地介绍了电子互连系统中可靠性的诸多基础科学问题及测试和解决方案, 涉及的概念、模型、方法等的阐述清晰易懂, +...... |
| 333 |
__ |
■a相关工程技术人员 |
| 510 |
1_ |
■aReliability of microtechnology■einterconnects, devices and+...... |
| 517 |
1_ |
■a互连、器件及系统■Ahu lian 、 qi jian ji xi tong |
| 606 |
0_ |
■a微电子技术■x可靠性■x研究■Awei dian zi ji shu |
| 690 |
__ |
■aTN4■v5 |
| 701 |
_1 |
■a刘建影■g(Liu, Johan)■4著■Aliu jian ying |
| 702 |
_0 |
■a郭福■4译■Aguo fu |
| 702 |
_0 |
■a马立民■4译■Ama li min |
| 801 |
|
■aCN■bGSXY■c20191018 |
| 905 |
|
■aGSXY■fTN4/L436■g1387703■g1387704■g1569477 |
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